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UID:69e4acf5497e8@leapup.bitshifters.cloud
DTSTAMP:20260419T122245Z
DTSTART:20210908T170000Z
DTEND:20210908T180000Z
SUMMARY:A Practical Approach to Utilizing the Open Model Interface (OMI) in Aging Analyses for Long Term Reliability Validation
DESCRIPTION:When designing ICs for automotive\, mobile communication\, IoT and other applications\, long term reliability validation has become an integral step in the verification process. To satisfy their customer&rsquo\;s needs for accurate aging simulations\, foundries face the requirement to provide corresponding aging models for accurate simulation of device degradation over time. Siemens EDA's AFS Platform allows to run aging simulations through models enabled by the new CMC industry standard Open Model Interface (OMI). In this presentation\, we will discuss aging challenges and benefits of OMI\, and the methodology needed to successfully utilize this new standard.
LOCATION:Fraunhofer IIS/EAS\, Dresden
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