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UID:69e4b8ee2930c@leapup.bitshifters.cloud
DTSTAMP:20260419T131350Z
DTSTART:20230524T150000Z
DTEND:20230524T160000Z
SUMMARY:How Design for Reliability methods support the development of long-living ICs
DESCRIPTION:The reliability of integrated circuits (ICs) and electronic systems is becoming increasingly important. This holds for many application scenarios\, such as automotive\, industrial\, medical\, communication\, etc. Design for Reliability methods allow virtual investigations on the durability of electronics to support the development of reliable ICs and systems. This webinar focuses on solution approaches for IC designers.\nMore
LOCATION:Fraunhofer IIS/EAS\, Dresden
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